Porosimetry for Thin Films of Metal–Organic Frameworks: A Comparison of Positron Annihilation Lifetime Spectroscopy and Adsorption?Based Methods

Thin films of crystalline and porous metal–organic frameworks (MOFs) have great potential in membranes, sensors, microelectronic chips. While the morphology crystallinity MOF can be evaluated using widely available techniques, characterizing their pore size, volume, specific surface area is challenging due to low amount material substrate effects. Positron annihilation lifetime spectroscopy (PALS) introduced as a powerful method obtain size information depth profiling films. The complementarity this approach established physisorption-based methods such quartz crystal microbalance (QCM) gravimetry, ellipsometric porosimetry (EP), Kr physisorption (KrP) illustrated. This comprehensive discussion on thin film supported by experimental data for ZIF-8.